17465Y NCH POWER MOSFET Reliability Qualification Report - Fairchild Discrete Power

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Package Qual Reliability Summary

Part Number Type		Die Type		Package
IRFP460		17465		TO-264
Test 8100
Stress	Conditions	Results	Sample Size	Duration
IOL	PD=7.0W, delta Tj=100C	0	40	8750	Cyc
HT Drain Bias	Tc=150C, Vds=80% Rated	0	39	500	Hrs
HT Gate Bias	Tc=150C, Vgs=100% Rated	0	40	1000	Hrs
Temp Cycle	-55C, +150C, Air	0	38	1000	Cyc
Autoclave	Ta=121C, 15psi	0	40	96	Hrs
H³TRB	Ta=85C, RH=85%, Vds=40V	0	40	1000	Hrs
Operating Life	Tc=150, Vds=15V	0	40	1000	Hrs

Part Number Type		Die Type		Package
IRFP460		17465		TO-264
Test 8094
Stress	Conditions	Results	Sample Size	Duration
IOL	PD=7.0W, delta Tj=100C	0	40	8750	Cyc
HT Drain Bias	Tc=150C, Vds=80% Rated	0	40	500	Hrs
HT Gate Bias	Tc=150C, Vgs=100% Rated	0	40	1000	Hrs
Temp Cycle	-55C, +150C, Air	2	40	1000	Cyc
Autoclave	Ta=121C, 15psi	0	40	96	Hrs
H³TRB	Ta=85C, RH=85%, Vds=40V	0	39	1000	Hrs
Operating Life	Tc=150, Vds=15V	0	40	1000	Hrs
Note 1 Bonding Problem corrected prior to production release

Part Number Type		Die Type		Package
IRFP460		17465		TO-264
Test 8102
Stress	Conditions	Results	Sample Size	Duration
IOL	PD=7.0W, delta Tj=100C	0	40	8750	Cyc
HT Drain Bias	Tc=150C, Vds=80% Rated	0	40	500	Hrs
HT Gate Bias	Tc=150C, Vgs=100% Rated	0	39	1000	Hrs
Temp Cycle	-55C, +150C, Air	0	39	1000	Cyc
Autoclave	Ta=121C, 15psi	0	40	96	Hrs
H³TRB	Ta=85C, RH=85%, Vds=40V	0	40	1000	Hrs
Operating Life	Tc=150, Vds=15V	0	40	1000	Hrs