2007 Product Change Notification (PCN)
| PCN# | PCN Date | Description of Change | Notification |
| Q4074814 | 12/20/2007 | (From): StatsChipPac Kuala
Lumpur, Malaysia (To): Fairchild Semiconductor Penang, Malaysia |
Q4074814.pdf |
| Q4074809 | 12/19/2007 | (From): StatsChipPac Kuala
Lumpur, Malaysia (To): Fairchild Semiconductor Penang, Malaysia |
Q4074809.pdf |
| Q4074804 | 12/19/2007 | (From): Fairchild Semiconductor
8-inch wafer fabrication line located in Mountaintop, Pennsylvania.
e (To): Fairchild Semiconductor QS 9000 approved 6-inch facility for
wafer fabrication located in Bucheon, Korea. |
Q4074804.pdf |
| Q4074805 | 12/17/2007 | (From): Selected Mosfet
products currently manufactured using the 8-inch line in Mountain Top,
PA. The backmetal for the affected products is being changed from 5KA,
3KA, 3.5KA, 20KA (AL-Ti-Ni-Ag). (To): Selected Mosfet devices currently
fabricated at Fairchild Semiconductor 8-inch line in Mountain Top,
PA, USA will be also manufactured at Advanced Semiconductor Manufacturing
Corporation (ASMC), the 6-inch facility for wafer fabrication located
in Shanghai, China. The backmetal of these selected devices is being
changed to 3KA, 2KA, 10KA (Ti-Ni-Ag). The new backmatal, Ti-Ni-Ag,
is a standard backmetal system used on other qualified MOSFET products.
There will be no additional change to the die layout, die size, geometry,
substrate, device specification, performance and function of any affected
devices. Quality and reliability will remain at highest standard. |
Q4074805.pdf |
| Q1070802-A | 12/13/2007 | (From): Currently being
manufactured at SPS(SP Semiconductor & Communication Co Ltd.) in
Korea (To): Qualify in Fairchild Semiconductor (Suzhou) Co., Ltd. China
as an Alternate Assembly and Test for TO220F 5 leads. (There is no
difference in package out line, process and bill of materials |
Q1070802-A.pdf |
| Q4074605 | 12/12/2007 | (From): SOIC-08 package
assemble in FSC approved manufacturing locations - Fairchild Malaysia,
Amkor, Carsem, Utac Thai Limited (UTL), Unisem, GEM and PSTS using
non-green mold compound as shown in table 1. (To): SOIC-08 package
assemble in FSC approved manufacturing locations - Fairchild Malaysia,
Amkor, Carsem, Utac Thai Limited (UTL), Unisem, GEM and PSTS using
green mold compound as shown in table 2. |
Q4074605.pdf |
| Q4074815 | 12/12/2007 | (From): SOT23 and SC70
package assembly at all FSC approved manufacturing locations (FSCP,
CARSEM, HANA, UTL, AUK in Dalian, China, JCET, FSPM) using non Green
mold compound as shown in table 1: (To): SOT23 and SC70 package assembly
at all FSC approved manufacturing locations (FSCP, CARSEM, HANA, UTL,
AUK in Dalian, China, JCET, FSPM) using Green mold compound as shown
in table 2: |
Q4074815.pdf |
| Q2072402-A | 12/7/2007 | (From): SPS , SP Semiconductor & Communication
Co Ltd. (To): FSSZ , Fairchild Semiconductor (Suzhou) Co., Ltd |
Q2072402-A.pdf |
| Q4074107-A | 12/7/2007 | (From): passivation layer
without Polyimide coating. (To): Polyimide coating will be added on
the passivation layer |
Q4074107-A.pdf |
| Q4074811 | 12/7/2007 | (From): SSOT-3 and SSOT-6
package assembly in FSC approved manufacturing locations using non-Green
mold compound as shown in table 1: (To): SSOT-3 and SSOT-6 package
assembly at all FSC approved manufacturing locations using Green mold
compound as shown in table 2: |
Q4074811.pdf |
| Q1070904 | 12/7/2007 | (From): Selected TO252,
TO262, and TO263 automotive products currently manufactured in Mountain
Top, PA using Fairchild's 8-inch Fab line. These products are presently
assembled and tested in Fairchild Semiconductor Cebu, Philippines or
STATSChipPAC Kuala Lumpur, Malaysia subcontractor facilities. The current
mold compound and plating material of the selected devices will be
changed. Please refer to detailed table on page 2 of this PCN. (To):
Selected products will now be produced on both 8-inch wafer diameter
(located in Mountain Top, PA) as well as 6-inch wafer diameter (located
in Bucheon, Korea; Fairchild Semiconductor QS 9000 and TS16949 certified
Bucheon, Korea). The plating finish is being changed to Matte Sn. For
mold compound changes please refer to detailed table on page 2 of this
PCN |
Q1070904.pdf |
| Q4074807 | 12/5/2007 | (From): Current die size:
76x38 (To): New die size: 83x40 |
Q4074807.pdf |
| Q4074403 | 12/04/2007 | (From): Fairchilds Micropak
packages are currently assembled at ASEM and Hana. These packages are
currently assembled as follows: Substrate: Bismaleimide Triazine (BT)
CCL-HL832 with NiAu plated, Die attach material: Die attach film LE5000
and LE5030, Wire: 0.8mils Au, Compound: HC-100-SG-BM, Lead Finish:
NiAu plated, Packages' dimension remains unchanged. Also refer to the
tables below for comparisons of this change. (To): Add FSPM (Fairchild
Malaysia) as an additional assembly location for Micropak package,
6-, 8-, and 10-leads. The package material details for the FSPM location
are as follows: LeadFrame: Copper frame A194 Full hard with NiPdAu
pre-plated, Die attach material: Die attach film LE5003, Wire: 0.8mils
Au, Compound: CK203P (Premold) and CK203M (Final mold), Lead Finish:
Matte Sn. The external package dimensions will remain unchanged. Additionally
the parts produced on FSPM assembly line will be identified by an _F113
suffix on Fairchild part number. |
Q4074403.pdf |
| Q4074806 | 1130/2007 | (From): TSSOP package
assembly at all FSC approved manufacturing locations using non Green
mold compound as shown in table 1. (To): TSSOP package assembly at
all FSC approved manufacturing locations using Green mold compound
as shown in table 2. |
Q4074806.pdf |
| Q4074701 | 11/30/2007 | (From): 8LD TSSOP package
assembly at all FSC approved manufacturing locations using non Green
mold compound as shown in table 1. (To): 8LD TSSOP package assembly
at all FSC approved manufacturing locations using Green mold compound
as shown in table 2. |
Q4074701.pdf |
| Q4074601 | 11/30/2007 | (From): FPG 8L MLP3x3
package assembly at all FSC approved manufacturing location(s) (Carsem)
using non Green mold compound as shown in table 1. (To): FPG 8L MLP
3x3 package assembly at all FSC approved manufacturing location(s)
(Carsem) using Green mold compound as shown in table 2. |
Q4074601.pdf |
| Q3073802-A | 11/29/2007 | (From): Current TO-220
heatsink and die attach pad thickness of 1.30mm. (To): New TO-220 heatsink
and die attach pad thickness will be 0.51mm. There is no change in
heatsink and die attach pad material. Conversion of heatsink thickness
will be done on a part by part basis starting WW05 of 2008 to prevent
mixing of product with different heat sink dimensions in shipments
during the transition period. |
Q3073802-A.pdf |
| Q3073801-A | 11/29/2007 | (From): Current TO-220
heatsink and die attach pad thickness of 1.30mm. Material composition
of wire used for wire bonding process is gold (Au) wire and copper
(Cu) wire. (To): New TO-220 heatsink and die attach pad thickness will
be 0.51mm. There is no change in heatsink and die attach pad material.
Material composition of wire used during wire bonding process will
be copper (Cu). Conversion of heatsink thickness will be done on a
part by part basis starting WW05 of 2008 to prevent mixing of product
with different heat sink dimensions in shipments during the transition
period. |
Q3073801-A.pdf |
| Q3073508-A | 11/29/2007 | (From): FAN5xxxUC WL-CSP
products are assembled and tested at the AMKOR facility (A5) in North
Carolina, USA. (To): FAN5xxxUC WL-CSP products will be assembled at
the AMKOR facility (K4) in Korea and tested at the AMKOR facility (T3)
in Taiwan. |
Q3073508-A.pdf |
| Q4074106-A | 11/29/2007 | (From): Switch products
currently manufactured using Fairchild's 6-inch, class 1, fab process
in South Portland, ME. (To): Switch product will now be produced on
both 6 inch and 8-inch wafer Diameters. Manufacturing will occur in
the same 6-inch Class-1 fab currently producing these products. In
some cases, new 8 inch equipment will be added to accommodate the 6
to 8 inch processing conversion. Die size, design, geometry, or layout
of the affected products remains un-changed. 8-inch products will be
fully compliant to all published data sheet specifications and will
be completely interchangeable with current 6-inch product. Quality
and reliability will remain at the highest standards already demonstrated
with Fairchild's existing products. |
Q4074106-A.pdf |
| Q3073505-A | 11/29/2007 | (From): TO220F 2 and 3
Leads are currently being manufactured at SPS (SP Semi)/ENOCH located
in Korea. (To): Qualify Fairchild Semiconductor located in Suzhou,
China as an Alternate Assembly and Test manufacturing site for TO220F
2 and 3 leads. There is no difference in the Package Outline, Bill
of materials and Process between the current and the Alternate manufacturing
site. |
Q3073505-A.pdf |
| Q3073401-A | 11/19/2007 | (From): DAP size from
1.4mm x 1.4mm non-matrix Also detector die size from 24mil x 24mil.
(To): DAP size to 2mm x 2.3mm matrix. Also, detector die size to 17mil
x 25mil. |
Q3073401-A.pdf |
| Q4070136 | 11/16/2007 | All standard Fairchild
Semiconductor products shipped after March 1, 2006 have met the RoHS
directive for Lead free lead finish; therefore it is not necessary
to continue to offer product both with and without the “_NL” No-Lead
indicator. Product ordered with or without the “_NL” indicator
is identical; there is no difference in manufacturing process, materials,
or device marking. |
Q4070136.pdf |
| Q4074501 | 11/15/2007 | (From): Selected planar
UltraFET products are currently manufactured using below fab locations:
1) Fairchild's 8" fab process in Mountain Top, PA, USA. 2) Advanced
Semiconductor Manufacturing Corp (ASMC) 6" fab process in Shanghai,
China. 3) Central Semiconductor Manufacturing Corp (CSMC) 6" fab
process in Wuxi, China. (To): Products will also be qualified using
Central Semiconductor Manufacturing Corp (CSMC) 6" fab process
located in Beijing, China. There will be no change to the layout, die
size, geometry, substrate, device specifications, performance and function
of any affected devices. Quality and reliability will remain at the
highest standard. The process and materials used are identical to the
original manufacturing sites. |
Q4074501.pdf |
| Q4074404 | 11/15/2007 | (From): Selected FS35C
2LM (0.35 micron 2 layer metal) logic products currently manufactured
using Fairchild's 6-inch Class 1 fab process in South Portland, ME.
(To): Products will now be produced on both 6-inch and 8-inch wafer
diameters. Manufacturing will occur in the same 6-inch Class 1 fab
currently producing these products. New 8-inch equipment has been added
to accommodate metal and dielectric layer planarization from SOG (Spin-on-glassivation)
to CMP (Chemical-mechanical polish). Die size, design, geometry, or
layout of the affected products remains unchanged. This change will
not impact the parametric performance or electrical characteristics
of any affected device. 8-inch product will be fully compliant to all
published datasheet specifications and will be completely interchangeable
with current 6-inch product. Quality and reliability will remain at
the highest standards already demonstrated with Fairchild's existing
products. |
Q4074404.pdf |
| Q4074001 | 11/13/2007 | (From): FPG MLP 3X3 and
SPG MLP 2.5X3.5 Assembly at Fairchild Semiconductor Malaysia Sdn. Bhd.
(To): Carsem Malaysia Sdn. Bhd. is being added as an additional manufacturing
site for FPG MLP 3X3 and SPG MLP 2.5X3.5 upon successful completion
of Fairchild's qualification process. Fairchild Semiconductor Malaysia
Sdn. Bhd. will continue to produce FPG MLP 3X3 and SPG MLP 2.5X3.5
package types. |
Q4074001.pdf |
| Q4074402 | 11/09/2007 | Alternate Assembly Site
Location / Qualification, Package Change (Lead Frame), Plating Material
Change. |
Q4074402.pdf |
| Q3073208-A | 11/09/2007 | (From): Change die attach epoxy, Hitachi EN4620K (To): Die attach epoxy, Henkel QMI-519 | Q3073208-A.pdf |
| Q4074105 | 11/02/2007 | (From): Two type of die
dimension: 0.35mm * 0.35mm for 2.0-20V DO35 product; 0.45mm * 0.45mm
for 22-75V DO35 product. (To): Consolidate to one die dimension 0.32
mm * 0.32 mm for 2.4V~75V DO35 product. There is no difference in package
dimension, process and electrical specification after change. |
Q4074105.pdf |
| Q4074301 | 11/02/2007 | (From): Aimhighglobal_Weihai
in China (To): AUK_Dalian in China It's also certified for TS16949
and ISO14001 certificated. Reason for Change : To fully transfer the
assembly & test process of TO92 high |
Q4074301.pdf |
| Q4074302 | 10/31/2007 | (From): Pre-Driver PMOS
pull-up 14x50 (700um ) x2 (To): Pre-Driver PMOS pull-up 14x50 (700
um) x1 Reason for |
Q4074302.pdf |
| Q4074103 | 10/30/2007 | (From): Current dual lead
frame (433086, 436489, 422170, 422162, 427732) (To): New matrix lead
frame (426895Q, 436896Q, 436897Q, 436898Q, 436899Q) |
Q4074103.pdf |
| Q4074202 | 10/30/2007 | (From): FANxxxx WL-CSP
products are assembled and tested at the Amkor A5 facility in North
Carolina, USA. (To): FANxxxx WL-CSP products will be also assembled
and tested at the Fairchild facility in Penang, Malaysia. |
Q4074202.pdf |
| Q4074106 | 10/22/2007 | (From): Switch products
currently manufactured using Fairchild's 6-inch, class 1, fab process
in South Portland, ME. (To): Switch product will now be produced on
both 6 inch and 8-inch wafer Diameters. Manufacturing will occur in
the same 6-inch Class-1 fab currently producing these products. In
some cases, new 8 inch equipment will be added to accommodate the 6
to 8 inch processing conversion. Die size, design, geometry, or layout
of the affected products remains un-changed. 8-inch products will be
fully compliant to all published data sheet specifications and will
be completely interchangeable with current 6-inch product. Quality
and reliability will remain at the highest standards already demonstrated
with Fairchild's existing products. Reason for Change : Fairchild Semiconductor
is adding 8 inch wafer capacity for processing |
Q4074106.pdf |
| Q4074107 | 10/19/2007 | (From): passivation layer
without Polyimide coating (To): Polyimide coating will be added on
the passivation layer |
Q4074107.pdf |
| Q2071901-B | 10/16/2007 | (From): FPG MLP 2x2 Assembly
at FSC Penang only (To): FPG MLP 2x2 Assembly at FSC Penang & subcon,
Carsem |
Q2071901-B.pdf |
| Q3073704 | 10/12/2007 | (From): Copper lead frame
(To): Copper leadframe or Iron lead frame (Qualification of Iron(Fe)leadframe
as alternate material for TO92 package) |
Q3073704.pdf |
| Q3073705 | 10/12/2007 | (From): Wirebond material
using 2mil Gold (Au) wire for SO8 devices manufactured in subcontractor
site, GEM Electronics Ltd Shanghai China. (To): Wirebond material using
2mil Copper (Cu) wire for SO8 devices manufactured in subcontractor
site, GEM Electronics Ltd Shanghai China. |
Q3073705.pdf |
| Q3073802 | 10/09/2007 | (From): Thicker heatsink
and die attach pad. (To): Thinner heatsink and die attach pad (there
is no change in heatsink and die attach pad material). |
Q3073802.pdf |
| Q3073801 | 10/09/2007 | (From): Thicker heatsink
and die attach pad. Material composition for wire used during wire
bonding process is gold wire and copper. (To): Thinner heatsink and
die attach pad (there is no change in heatsink and die attach pad material).
Material composition for wire used during wire bonding process will
be copper. |
Q3073801.pdf |
| Q2071603-B | 10/3/2007 | (From): AUK in Korea Description
of Change (To): Jiangsu Changjiang Electronics Technology (JCET) in
China is being qualified as an additional SOT89 package assembly/test
site, There is no difference in package dimension, process and electrical
specification between the two sites. (Marketing outline drawing refer
to MKT-MA03C). |
Q2071603-B.pdf |
| Q3073404 | 9/27/2007 | (From): Current dual leadframe
(433086, 436489, 422170, 422162, 427732) Description of Change (To):
New matrix leadframe (436895Q, 436896Q, 436897Q, 436898Q, 436899Q) |
Q3073404.pdf |
| Q3073302 | 9/27/2007 | (From): Bonding wire material
is Gold (Au) Description of Change (To): Bonding wire material is Copper
(Cu). |
Q3073302.pdf |
| Q3073602 | 9/21/2007 | (From): Current Marking
/ Flowcode Description of Change (To): Aligned Marking / Flowcode |
Q3073602.pdf |
| Q3073510 | 9/21/2007 | (From): FDSS2407, FDSS2407_SB82086,
FDSS2407_SB82097 devices manufactured with No Passivation. Description
of Change (To): FDSS2407, FDSS2407_SB82086, FDSS2407_SB82097 devices
manufactured with Nitride Passivation. |
Q3073510.pdf |
| Q1071304-A | 9/13/2007 | (From) STS in Korea Description
of Change (To): PSTS in China. It's also certified for ISO9001, QS-9000
and ISO14001 certificated. |
Q1071304-A.pdf |
| Q3073401 | 9/13/2007 | (From): Strip leadframe
Description of Change (To): Matrix leadframe (no change to leadframe
dimensions) |
Q3073401.pdf |
| Q3073508 | 9/11/2007 | (From): FAN5xxxUC WL-CSP
products are assembled and tested at the AMKOR facility (A5) in North
Carolina, USA (To): FAN5xxxUC WL-CSP products will be assembled at
the AMKOR facility (K4) in Korea and tested at the AMKOR facility (T3)
in Taiwan. |
Q3073508.pdf |
| Q3073506 | 9/11/2007 | (From): 8um/40V fab process
in Bucheon, Korea. (To): 1.5um/40V fab process in Bucheon, Korea. Functionality
and electrical characterics remain within current datasheet specifications. |
Q3073506.pdf |
| Q3073305 | 9/7/2007 | (From): Current wafer
and die sales Assembly Site: STATSChipPAC MALAYSIA SDN BHD (SCM) at
73, Lorong Enggang ulu Kelang FTZ, 54200 Kuala Lumpur, Malaysia. (To):
New wafer and die sales Assembly Site: FAIRCHILD SEMICONDUCTOR (PHILIPPINES),
INC. (FSCP) at MEPZ, Lapu-lapu City, Cebu Philippines 6015. |
Q3073305.pdf |
| Q3073505 | 9/7/2007 | (From): SPS/Enoch (To):
Fairchild Suzhou China |
Q3073505.pdf |
| Q3073502 | 9/7/2007 | (From): SPS/Enoch (To):
Fairchild Suzhou China |
Q3073502.pdf |
| Q3073504 | 9/7/2007 | (From): AHG (To): Fairchild
Suzhou China |
Q3073504.pdf |
| Q3073503 | 9/7/2007 | (From): SPS (To): Fairchild
Suzhou China |
Q3073503.pdf |
| Q3073402 | 9/6/2007 | (From): 8-mil Aluminum
wire bonding material on Source pad/lead connection.(To): 40 mils x
6 mils Aluminum ribbon bonding material on Source pad/lead connection. |
Q3073402.pdf |
| Q3073113 | 9/5/2007 | (From): TO126 currently
assembled/tested at Aimhigh Global_ Weihai and Shantou Huashan Electronic,
both in China. (To): Aimhigh Global_Weihai will be removed from AVL
and replaced by AUK_Dalian in China as an alternative site for TO126
assembly/test with no changes to BOM and package dimensions. Shantou
Huashan Electronic in China will remain as an assembly/test site for
the TO126. Both listed suppliers are ISO9001, ISO4001 and TS-16949
certified. |
Q3073113.pdf |
| Q3073208 | 9/4/2007 | Description of Change
(From): Change die attach epoxy, Hitachi EN4620K Description of Change
(To): Die attach epoxy, Henkel QMI-519 |
Q3073208.pdf |
| Q3073202 | 9/4/2007 | (From): StatsChipPAC (Kuala
Lumpur, Malaysia) (To): Fairchild Semiconductor (Suzhou, China) |
Q3073202.pdf |
| Q3073204 | 8/31/2007 | (From): StatsChipPAC
(Kuala Lumpur, Malaysia) (To): Fairchild Semiconductor (Suzhou, China)
Note 1: For products FGD3N60LSDTM, RHRD660S9A_S2515, RURD620CCS9A_SB82068,
RURD4120S9A_SB82080, RURD660S_R4812, RURD620CCS9A_R4870,FGD3N60LSDTM_SB82092,
the rectifier die diameter will change from 4" to 5"; Note
2: The molding compound for products HGTD1N120BNS9A will be EME6600CS;
The molding compound for products FGD3N60LSDTM, RURD620CCS9A_R4870,
RURD660S_R4812,FGD3N60LSDTM_SB82092 will be KTMC5900; The molding compound
for products RHRD660S9A_S2515, RURD620CCS9A_SB82068,RURD4120S9A_SB82080
will be AMC2RC. |
Q3073204.pdf |
| Q3073304 | 8/30/30 | (From): Veh : 2.13/2.4/2.57(V)
(To): Veh :2/2.4/2.8(V) |
Q3073304.pdf |
| Q3073212 | 8/28/2007 | (From): Current UBM:
Sputtering UBM - Ti-Cu; Solder Bumping at Amkor Technology, Inc, A5-Unitive,
140 Southcenter Ct, Suite 600Morrisville, NC 27560. (To): Alt UBM:
Salt Lake, UT will add polyimide and metal layers;PacTech will add
ENiAu; Solder Bumping will be done at FSC, Cebu, Philippines. |
Q3073212.pdf |
| Q3073213 | 8/24/2007 | (From): StatsChipPAC
(Kuala Lumpur, Malaysia) (To): Fairchild Semiconductor (Suzhou, China) |
Q3073213.pdf |
| Q1070803-A | 8/24/2007 | (From): Current Assembly
site: STATSChipPAC, Shanghai Description of Change (To): Alternate
Assembly site: Fairchild, Malaysia |
Q1070803-A.pdf |
| Q3073203 | 8/22/2007 | (From): StatsChipPAC (Kuala Lumpur, Malaysia) To): Fairchild Semiconductor (Suzhou, China) Note 1: For products HGTP12N60A4D_NW82098 and RHRP860_R4647 the Rectifier die Diameter will change from 4" to 5"; Note 2: The molding compound for products HGTP12N60A4D_NW82098 and RHRP860_R4647 will be EME6600CS. The molding compound for all other products will be SI7200DX2. |
Q3073203.pdf |
| Q3073214 | 8/22/2007 | (From): StatsChipPAC (Kuala Lumpur, Malaysia) (To): Fairchild Semiconductor (Suzhou, China) Note 1: For products HGT1S7N60A4DS9A_R4921 and FFB20UP20DN_SB82117 the rectifier die diameter will change from 4" to 5"; Note 2: The molding compound for products HGT1S7N60A4DS9A_R4921 and FFB20UP20DN_SB82117 will be KTMC5900, the molding compound for all other products will be EME6600CS. |
Q3073214.pdf |
| Q1070501-C | 8/22/2007 | (From): Wire bond material currently used for our MLP 5x6 discrete products assembled from Fairchild (M), FSPM facility will be changed from Au wire to Cu wire. Package with this change will have an identifier. There will be no change in terms of wire diamter and type of thermosonic bonding process applied. (To): From Au wire used in MLP 5x6 Discrete products to Cu wire |
Q1070501-C.pdf |
| Q3073114 | 8/22/2007 | (From): StatsChipPAC (Kuala Lumpur, Malaysia) (To): Fairchild Semiconductor (Suzhou, China) |
Q3073114.pdf |
| Q3073115 | 8/22/2007 | (From): StatsChipPAC (Kuala Lumpur, Malaysia) (To): Fairchild Semiconductor (Suzhou, China), (Note: The molding compound for products ISL9V3036D3S and FDD068AN03L will be EME6600CS, The molding compound for all other products will be AMC2RC) |
Q3073115.pdf |
| Q2071703-A | 8/14/2007 | (From): LMV324
and LMV358 in SOIC is currently Assembled and Tested at subcon Carsem,
Ipoh/Malaysia (To): To qualify LMV324 and LMV358 SOIC Assembly and
Test at |
Q2071703-A.pdf |
| Q3072902 | 8/13/2007 | (From): *Shipping box dimension: : 395*385*275mm (To): *Shipping box Dimension: : 390*370*310mm. |
Q3072902.pdf |
| Q1071101-A | 8/13/2007 | (From):
The original location of JCET SOT223 assembly line: No 275, Binjiang
Rd. M, Jiangyin, Jiangsu, P.R.C (To): The new location of JCET SOT223
assembly line: No 78 |
Q1071101-A.pdf |
| Q3072802 | 8/10/2007 | (From): Current
manufacturing location at Fairchild Semiconductor Malaysia Sdn. Bhd. |
Q3072802.pdf |
| Q3073201 | 8/10/2007 | From): Paper box packing for GBPC parts (To): Plastic tray + box + shrinkage film to pack the GBPC parts. |
Q3073201.pdf |
| Q3072901 | 8/9/2007 | (From): 1line: F logo 2line:device name & week code 3line:Device name) (To): 1line: F logo, assy plant code, week code 2line:Device name 3line:device name. |
|
| Q2071901-A | 8/6/2007 | (From): FPG MLP 2x2 Assembly at FSC Penang only (To): FPG MLP 2x2 Assembly at FSC Penang & subcon, Carsem. |
Q2071901-A.pdf |
| Q2071603-A | 8/1/2007 | (From):
AUK in Korea (To): Jiangsu Changjiang Electronics Technology (JCET)
in China is |
|
| Q3072701 | 8/1/2007 | (From): Existing epoxy and dye (Hysol) (To): Fairchild is adding Eclat, Epifine and Richtech as epoxy and dye material suppliers. All of the epoxy and dye materials are qualified to be used interchangeably. There is no difference in the form, fit, function or manufacturability of the devices when either the Hysol material or the alternate materials are used for assembly |
Q3072701.pdf |
| Q3072803 | 8/1/2007 | (From): Barcode lable was attached back of Reel. (To): Barcode lable was attached front of Reel. |
Q3072803.pdf |
| Q3072801 | 7/30/2007 | (From): Use of special flowcode for Cu devices. (To): Remove flowcode used for Cu devices and convert the standard part to Cu wire. |
Q3072801.pdf |
| Q3073001 | 7/30/2007 | (From): From Latch Circuit in Soft Start Block (To): To Nand Logic in the soft start block and there is no electrical specification change. |
Q3073001.pdf |
| Q1070805 | 7/19/2007 | (From): Wirebond material using 2mil Gold (Au) wire for SO8 devices manufactured in subcontractor site, GEM Electronics Ltd Shanghai China. (To): Wirebond material using 2mil Copper (Cu) wire for SO8 devices manufactured in subcontractor site, GEM Electronics Ltd Shanghai China. |
Q1070805.pdf |
| Q2072608 | 7/13/2007 | (From): TSC(TianJing)
(To): TSC(YangXin) is being added as an alternative assembly/test |
Q2072608.pdf |
| Q2072402 | 6/29/2007 | (From):
AHG (To): Fairchild Suzhou in China is being added as an alternative |
Q2072402.pdf |
| Q1070804 | 06/26/2007 | (From): Current assembly and test site: ChipPAC, Malaysia (To): Alternate assembly and test site: Suzhou, China. This facility is located at 1 Sutong Road, China-Singapore Suzhou Industrial Park Suzhou, Jiangsu P. R. of China. |
Q1070804.pdf |
| Q2072501 | 6/26/2007 | (From): AUK in Korea AHG in China (To): AUK Dalian in China will be qualified as an alternatate assembly site for TO92 package. In addition to current suppliers,It is also TS16949 and ISO14001certified. |
Q2072501.pdf |
| Q2072502 | 6/26/2007 | (From): FANxxxx
WL-CSP products are assembled and tested at the Amkor facility in North
Carolina, USA. (To): FANxxxx WL-CSP products will be also assembled
and tested at |
Q2072502.pdf |
| Q2071909 | 6/26/2007 | (From): There are some items which will be corrected from gFS: 15S(Typ)// td(on): 7.2ns(Typ), 25(max)// tr: 68ns(typ), 146ns(max)// td(off): 77ns(typ), 164ns(max)// tf: 93ns(typ), 196ns(max)// trr: 62ns(typ)// Qrr: 150nC(typ) (To): to gFS: 32S(Typ)// td(on): 39ns(Typ), 88(max)// tr: 181ns(typ), 372ns(max)// td(off): 183ns(typ), 376ns(max)// tf: 82ns(typ), 173ns(max)// trr: 80ns(typ)// Qrr:193nC(typ) |
Q2071909.pdf |
| Q2071902 | 6/26/2007 | (From): Signetics in Korea (To): PSTS (Phoenix Semiconductor Telecommunication (suzhou) CO., LTD) in China |
Q2071902.pdf |
| Q20072004 | 6/26/2007 | (From): There are no passivation layer. (To): Adding Passivation layer on front metal. |
Q20072004.pdf |
| Q2071907 | 5/21/2007 | (From): Lite-on Shanghai,China (To): In addition to Lite-On Shanghai, China; Taiwan Semiconductor Company, Tianjin, China is being added as an alternative assembly/test location. |
Q2071907.pdf |
| Q2072401 | 6/19/2007 | (From): 1. Shutdown Current decay time ~ 30 sec 2. Power Good logic is high when En goes low 3. Third line marking has "C" (To): 1. Shut down current decay time ~ 1 msec 2. Power Good logic is low when En is low 3. Third line marking has "C1" |
Q2072401.pdf |
| Q1070908-A | 5/18/2007 | (From): Adding
Fairchild Assembly site in Penang, Malaysia as alternate Assembly site
for Signetic, Korea (To): Qualify Fairchild Assembly site in Penang,
Malaysia to assemble |
Q1070908-A.pdf |
| Q2071905 | 5/18/2007 | (From):
Die change. (To): Four changes were made to the current production
die with metal |
Q2071905.pdf |
| Q1070501-B | 5/16/2007 | (From): Wire bond material currently used for our MLP 5x6 discrete products assembled from Fairchild (M), FSPM facility will be changed from Au wire to Cu wire. Package with this change will have an identifier. There will be no change in terms of wire diameter and type of thermosonic bonding process applied. (To): From Au wire used in MLP 5x6 Discrete products to Cu wire |
Q1070501-B.pdf |
| Q1071305-A | 6/14/2007 | (From): ENOCH, SP, STS in Korea, SHEDCL in China.(To): ENOCH, SP in Korea, SHEDCL and PSTS in China. |
Q1071305-A.pdf |
| Q2071901 | 5/14/2007 | (From): FPG MLP 2x2 Assembly at FSC Penang only (To): FPG MLP 2x2 Assembly at FSC Penang & subcon, Carsem |
Q2071901.pdf |
| Q2072203 | 6/13/2007 | (From):
Current Plating Coverage: Full NiPdAu Plating. Current Die attach Material:
Tin-Antimony (Sn8.5Sb). (To): Proposed Plating Coverage: Selective
NiPdAu plating on the |
Q2072203.pdf |
| Q1070907-A | 6/13/2007 | (From): STATS ChipPAC in Malaysia (To): STATS ChipPAC in Malaysia and Fairchild Suzhou China |
Q1070907-A.pdf |
| Q2071910 | 6/13/2007 | (From): TO-3PN Package :L/F plating change : from Bare Cu L/F + With pre-bake process (To): to Ni plated L/F + Without pre-bake process |
Q2071910.pdf |
| Q2072102 | 6/12/2007 | (From): Aim High Global in Korea (To): Fairchild Suzhou China |
Q2072102.pdf |
| Q2072201 | 6/11/2007 | (From): aimhigh global corp. in Korea. (To): SP Semiconductor & Communication Co., Ltd. in Korea. |
Q2072201.pdf |
| Q2071701 | 6/8/2007 | (From): Fairchild (Suzhou) in China (To): GEM (Shanghai) in China |
Q2071701.pdf |
| Q2071605 | 6/6/2007 | (From): Au wire bonding in SPM3/3V package (To): Copper wire bonding in SPM3/3V package |
Q2071605.pdf |
| Q1070903-A | 6/4/2007 | (From): Current die size: 76x38. With no gate runner. (To): New die size: 83x40. With 1 gate runner. |
Q1070903-A.pdf |
| Q2072101 | 5/30/2007 | (From): Fairchild
Semiconductor products, 74AC138, 74AC139, 74ACT138 and 74ACT139 are
currently manufactured in South Portland, Maine using a 6-inch |
Q2072101.pdf |
| Q1071307 | 5/11/2007 | (From): TiNiAg Backmetal and eutectic die attach process (To): TiNiAg backmetal and skip cure adhesive die attach process |
Q1071307.pdf |
| Q2071704 | 5/11/2007 | (From): Fairchild (Suzhou) in China (To): GEM (Shanghai) in China |
Q2071704.pdf |
| Q1070902-A | 5/9/2007 | (From): Mold compound Sumitomo G770; Bond wire HP(99.99); Solder ball composition SAC405; Solder mask material AUS05 (To): Mold compound Nitto GE-100-LFC-S; Bond wire HTS(99.0); Solder ball composition SAC105; Solder mask material AUS308 Pg. 1 |
Q1070902-A.pdf |
| Q2071703 | 5/9/2007 | (From): LMV324 and LMV358 is currently Assembled and Tested at Carsem (To): To qualify Assembly and Test at Penang |
Q2071703.pdf |
| Q1070601-A | 5/8/2007 | (From): 8-pin DIP coplanar construction (225C max reflow solder rating) (To): 8-pin DIP over-under construction (260C max reflow solder rating). |
Q1070601-A.pdf |
| Q1071104 | 5/8/2007 | (From): Current assembly location: ChipPAC, Malaysia (To): Alternate assembly location: Suzhou, China |
Q1071104.pdf |
| Q2071702 | 5/7/2007 | (From):
Die change To): Four changes were made to the current production die
with metal mask updates. Change 1: The receiver serial clock signal
was delayed to better center on the |
Q2071702.pdf |
| Q2071501 | 4/30/2007 | (From): Change
in carrier tape dimension from Ao = 1.67 +/- 0.05 mm, Bo = 1.17 +/-
0.05 |
Q2071501.pdf |
| Q1071005-A | 4/27/2007 | (From): 1. Die attach method: Two chip die attach 2. Wire size & QTY:20mil *2ea per chip 3. Ass'y site for TO-220: SP, FSSZ Jedec, SHEDCL (To): 1. Die attach method: Dual chip die attach 2. Wire size & QTY:15mil *1ea per chip 3. Ass'y site for TO-220: SP, FSSZ Jedec, SHEDCL, FSSZ none Jedec, Enoch. |
Q1071005-A.pdf |
| Q2071401 | 4/26/2007 | (From): Mold Compound Sumitomo G770 (To): Mold Compound Nitto GE-100-LFC-S |
Q2071401.pdf |
| Q2071601 | 4/26/2007 | (From): PanJIT Electronics International Inc. (To): Taiwan Semiconductor Co., Ltd. |
Q2071601.pdf |
| Q3063801 | 4/19/2007 | (From): SOT-89 Lead frame pad with hole. (To): SOT-89 Lead frame pad without hole. |
Q3063801.pdf |
| Q2071503 | 4/19/2007 | (From): FAB process : 8um/40V (To): FAB process : 1.5um/40V |
Q2071503.pdf |
| Q1071101 | 4/18/2007 | (From): The original location of JCET SOT223 assembly line: No 275, Binjiang Rd. M, Jiangyin, Jiangsu, P.R.C (To): The proposed new location of JCET SOT223 assembly line: No 78 Changshan Rd. Jiangyin, Jiangsu, P.R.C |
Q1071101.pdf |
| Q1071202 | 4/18/2007 | (From): 1) Noise sensitivity causing logic errors. 2) Test program measure Ilim pin voltage at fixed Vcc 3) Third line top mark: C (To): 1) Add a noise filter in the logic block to reduce the sensitivity to noise. 2) Test program revised to insure stability of Ilim pin voltage versus Vcc. 3) Third line top mark: C1 |
Q1071202.pdf |
| Q1070908 | 4/5/2007 | (From): Adding
Fairchild Assembly site in Penang, Malaysia as alternate |
Q1070908.pdf |
| Q1071201 | 4/2/2007 | (From): The
current 74F161A, 74F163A, 74F191 and 74F269 data sheets specify a minimum
FMAX (Maximum Clock Frequency) and/or a typical FMAX value at room
and at temperature.(To): The revised data sheets will specifiy only
a typical FMAX value at |
Q1071201.pdf |
| Q1070601 | 3/27/2007 | (From): 8-pin DIP coplanar construction (To): 8-pin DIP over-under construction |
Q1070601.pdf |
| Q1070906 | 3/26/2007 | (From): Current fab location: Salt Lake, Utah (To): Alternate fab location: Mountain Top, PA |
Q1070906.pdf |
| Q4065002 | 3/23/2007 | (From): See details in Change From table (To): See details in Change To table |
Q4065002.pdf |
| Q1070902 | 3/20/2007 | (From):
To improve the robustness of the package bill of materials resulting
in increased resistance to intermettalic degradation, use of a Green
mold compound, and improved tolerance to mechanical shock. Overall,
the BOM change is being pursued to |
Q1070902.pdf |
| Q1070907 | 3/20/2007 | (From): STATS ChipPAC in Malaysia (To): STATS ChipPAC in Malaysia and Fairchild Suzhou China |
Q1070907.pdf |
| Q1071005 | 3/20/2007 | QTY:20mil*2ea per chip 3. Ass'y site for TO-220: SP, FSSZ Jedec, SHEDCL Description of Change (To): 1. Die attach method: Dual chip die attach 2. Wire size & QTY:15mil *1ea per chip 3. Ass'y site for TO-220: SP, FSSZ Jedec, SHEDCL, FSSZ none Jedec, Enoch. |
Q1071005.pdf |
| Q1071004 | 3/20/2007 | (From):
Die attach method: Two chip die attach Wire size & QTY : 20mil
*2ea per chip Ass'y site for TO-220F: SP. (To): Die attach method:
Dual chip die attach Wire size & QTY : |
Q1071004.pdf |
| Q1070903 | 3/16/2007 | (From): Current die size: 76x38 With no gate runner (To): New die size: 83x40 With 1 gate runner |
Q1070903.pdf |
| Q1070402 | 3/09/2007 | (From): Current
assembly and test site: SCM - ChipPAC, Malaysia. To change from single
15mil wire-bond. (To): Alternate assembly and test site: FSSZ - Suzhou,
China. To single |
Q1070402.pdf |
| Q1071001 | 3/9/2007 | (From): Typical value of Reverse Recovery Charge is 2.1uC. (Condition: VGS = 0 V, IS = 15 A,dIF / dt = 100 A/?s) (To): Typical value of Reverse Recovery Charge is 0.4uC. (Condition : VGS = 0 V, IS = 15 A,dIF / dt = 100 A/?s) |
Q1071001.pdf |
| Q3064005 | 3/8/2007 | (From): Fairchild
will change the cover tape used in packaging BGA |
Q3064005.pdf |
| Q1070501 | 3/5/2007 | (From): Wire
bond material currently used for our MLP 5x6 discrete |
Q1070501.pdf |
| Q1070803 | 3/2/2007 | (From): Current
Assembly site: STATSChipPAC, Shanghai |
Q1070803.pdf |
| Q1070201 | 2/28/2007 | (From): Standard
1.5 x 1.5 BGA lead frame. See drawings attached under "Change
To" section. |
Q1070201.pdf |
| Q1070101 | 2/13/2007 | From): Change in carrier tape pocket hole dimension from 1.0 mm (To): Change in carrier tape pocket hole dimension to 0.8 mm. |
Q1070101.pdf |
| Q1070401 | 2/1/2007 | (From): Eliminate the Caution Label found in the moisuture barrier bag per IPC/JEDEC J-STD-033B (To): An additional label is placed on the bag to indicate the Level 1 classification and maximum reflow temperature information in human readable form. See attached sample: |
Q1070401.pdf |
| Q1070302 | 1/29/2007 | (From): Fairchild
Semiconductor products, 74AC245 and 74ACT245 are currently manufactured
in South Portland, Maine using a 6-inch FACT2.0 process.(To): Fairchild
Semiconductor will produce these products at wafer Fab, CSMC, located
in WuXi, China (PRC). The products listed in the FSID list at the bottom
of this |
Q1070302.pdf |
| Q2062704 | 1/23/2007 | (From): Fairchild Bucheon managed devices are using two types of Lead frame (Groove type, Non Groove type) for devices packaged in D/I-PAK.(To): One type of Lead frame(Non Groove type) will be used. |
Q2062704.pdf |
| Q4064501 | 1/23/2007 | (From): PanJIT Electronics International Inc. (To): Taiwan Semiconductor Co., Ltd |
Q4064501.pdf |
| 20060301-B | 1/18/2007 | Fairchild Semiconductor is qualifying Nantong-Fujitsu Microelectronics, based in Nantong, Jiangsu Province, China as the out-source assembly and test location for NMDIP package types that are currently assembled and tested in Fairchild Malaysia facility. These NMDIP products will be completely out-source to Nantong upon successful completion of Fairchild's qualification process. Nantong-Fujitsu Microelectronics is ISO9001:2000, QS9000 and ISO14001 certified. |
20060301-B.rtf |
| Q4064901 | 1/09/2007 | Fairchild issued an initial company-wide PCN to all customers of record announcing the transition to Pb-free products on July 11, 2003 (PCN # 20032701). In that notification, the following statement was made, “The manufacture of products with tin-lead plating will be completely discontinued as products with lead-free finish are introduced. After the transition period, Fairchild's standard products will only be available with a lead-free finish”. An additional notification was sent to all customers of record on May 24, 2004 (PCN # 20032701-A) which stated, “As each package type is converted, the manufacture of products with traditional SnPb plating will be completely discontinued. After the transition period, Fairchild’s standard products will only be available with a Pb-free finish”. As stated on the Pb-free section of Fairchild’s website, “Fairchild's goal is to transition all customers to Pb-free products. We do understand that for various reasons, some customers will not be ready to convert to Pb-free processing at this time. Fairchild will help these customers by continuing a supply of SnPb products for as long as manufacturing capability and viable customer demand exists. However, many of our manufacturing facilities and partners no longer have the ability to provide SnPb plating. Several others are likely to eliminate SnPb plating by the end of calendar year 2006. It is likely that our ability to provide SnPb plated products after the beginning of 2007 will be limited”. Since the conversion to Pb-free, Fairchild has continued efforts to support customers with SnPb products whenever possible. However, the overwhelming acceptance of Pb-free products has led to a greatly reduced demand for SnPb devices and it is becoming increasingly difficult to source these parts. At this time Fairchild can no longer commit to a continued supply and must follow through on the previous customer notifications to completely discontinue the support for SnPb products. |
Q4064901.pdf |
| Q4064703 | 12/18/2006 | (From):
LM358 and LM393 use the 8um/40V Bipolar process in FCS, |
Q4064703.pdf |
Note: for more product change notification customer letters, please visit PCNalert.com (exiting Fairchild)


